Herbert, Christopher G.
Mass Spectrometry Basics / Christopher G. Herbert y Robert A.W. Johnstone - Estados Unidos de América : CRC PRESS 2003 - 474 p.
Chemical Ionization 2.Laser desorption Ionization 3.Electron Ionization (EI) 4.Fast-Atom Bombardment (FAB) and liquid phase secondary Ion Mass Spectrometry (LSIMS) Ionization 5.Field Ionization(FI) and field desorption 6.Coronas, plasmas and arcs 7.Thermal Ionization(TI)surface emission of lons 8.Electrospray Ionization 9.Atmospheric Pressure Ionization(API) 10.Z-Spray combined Inlet/Ion source 11.Thermospray and plasmaspray Interfaces 12.Particle -Beam interface 13.Dynamic fast-atom bombardment and liquid -phase secondary Ion Mass spectrometry (FAB/LSIMS) interface
0849313546
US dollar: 380.000
Análisis de Espectro
Masas
Espectrometría de Masas
543.0873 / H536
Mass Spectrometry Basics / Christopher G. Herbert y Robert A.W. Johnstone - Estados Unidos de América : CRC PRESS 2003 - 474 p.
Chemical Ionization 2.Laser desorption Ionization 3.Electron Ionization (EI) 4.Fast-Atom Bombardment (FAB) and liquid phase secondary Ion Mass Spectrometry (LSIMS) Ionization 5.Field Ionization(FI) and field desorption 6.Coronas, plasmas and arcs 7.Thermal Ionization(TI)surface emission of lons 8.Electrospray Ionization 9.Atmospheric Pressure Ionization(API) 10.Z-Spray combined Inlet/Ion source 11.Thermospray and plasmaspray Interfaces 12.Particle -Beam interface 13.Dynamic fast-atom bombardment and liquid -phase secondary Ion Mass spectrometry (FAB/LSIMS) interface
0849313546
US dollar: 380.000
Análisis de Espectro
Masas
Espectrometría de Masas
543.0873 / H536