Cohen, Samuel H.
Atomic force microscopy : scanning tunneling microscopy 3 / Samuel H. Cohen - New York : Kluwer Academic Publisher, 1999 - 210 p.
Ingreso MCM
1. Keynote paper : A practical approach to understanding surface metrology and its applications 2. Applications of scanning probe microscopy in materials science : examples of surface modification and quantitative analysis 3. Scanning probe microscopy in biology with potential applications in forescics 4. Atomic manipulation of hydrogen on hydrogen-terminated silicon surfaces with scanning tunneling microscope 5. Apollo 11 lunar samples : An examination using tapping mode atomic force microscopy and other microscopic methods
0306462974
Atomic force microscopy
502.82 / C678
Atomic force microscopy : scanning tunneling microscopy 3 / Samuel H. Cohen - New York : Kluwer Academic Publisher, 1999 - 210 p.
Ingreso MCM
1. Keynote paper : A practical approach to understanding surface metrology and its applications 2. Applications of scanning probe microscopy in materials science : examples of surface modification and quantitative analysis 3. Scanning probe microscopy in biology with potential applications in forescics 4. Atomic manipulation of hydrogen on hydrogen-terminated silicon surfaces with scanning tunneling microscope 5. Apollo 11 lunar samples : An examination using tapping mode atomic force microscopy and other microscopic methods
0306462974
Atomic force microscopy
502.82 / C678
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