Mass Spectrometry Basics / Christopher G. Herbert y Robert A.W. Johnstone
Material type: TextPublisher: Estados Unidos de América : CRC PRESS 2003Description: 474 pISBN: 0849313546Subject(s): Análisis de Espectro | Masas | Espectrometría de MasasDDC classification: 543.0873
Contents:
Chemical Ionization 2.Laser desorption Ionization 3.Electron Ionization (EI) 4.Fast-Atom Bombardment (FAB) and liquid phase secondary Ion Mass Spectrometry (LSIMS) Ionization 5.Field Ionization(FI) and field desorption 6.Coronas, plasmas and arcs 7.Thermal Ionization(TI)surface emission of lons 8.Electrospray Ionization 9.Atmospheric Pressure Ionization(API) 10.Z-Spray combined Inlet/Ion source 11.Thermospray and plasmaspray Interfaces 12.Particle -Beam interface 13.Dynamic fast-atom bombardment and liquid -phase secondary Ion Mass spectrometry (FAB/LSIMS) interface
Item type | Current location | Call number | Copy number | Status | Date due | Barcode |
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Libros/ General | Biblioteca Central Euclides Jaramillo Arango | 543.0873 H536 (Browse shelf) | Ej. 1 | Available (Sin restricciones) | 054365 |
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Chemical Ionization 2.Laser desorption Ionization 3.Electron Ionization (EI) 4.Fast-Atom Bombardment (FAB) and liquid phase secondary Ion Mass Spectrometry (LSIMS) Ionization 5.Field Ionization(FI) and field desorption 6.Coronas, plasmas and arcs 7.Thermal Ionization(TI)surface emission of lons 8.Electrospray Ionization 9.Atmospheric Pressure Ionization(API) 10.Z-Spray combined Inlet/Ion source 11.Thermospray and plasmaspray Interfaces 12.Particle -Beam interface 13.Dynamic fast-atom bombardment and liquid -phase secondary Ion Mass spectrometry (FAB/LSIMS) interface
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