Scanning electron microscopy and x-ray microanalysis / Joseph Goldstein
Material type: TextLanguage: English Publisher: New York : Kluwer Academic, 2003Edition: 3a edDescription: 689 pISBN: 0306472929Subject(s): Scanning electron microscopy | X-Ray MicroanalysisDDC classification: 502.825Item type | Current location | Collection | Call number | Copy number | Status | Date due | Barcode |
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Libro OptoElectrónica | Laboratorio de Optoelectrónica RESERVA | Papel | 502.825 G617 (Browse shelf) | Ej. 1 | Available | L000549 |
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500.8 A213 Hombres de ciencia e independencia: | 502 R363 3ed. Transmission electron microscopy : | 502.82 C678 Atomic force microscopy : scanning tunneling microscopy 3 / Cohen, Samuel H. | 502.825 G617 Scanning electron microscopy and x-ray microanalysis / | 510.62 K92 3ed. Matemáticas avanzadas para ingeniería / | 515.1 R573 Mathematical methods for physics and engineering / Riley, K. F. | 515.2433 Ch563 2ed. Fourier series and boundary value problems / |
Con CD
1. Introduction 2. The SEM and Its Modes of Operation 3. Electron Beam-Specimen Interactions. 4. Image formation and interpretation 5. Special topics in Scanning electron microscopy 6. Generation of X-Rays in the SEM Specimen 7. X-Ray Spectral Measurement : EDS and WDS 8. Qualitative X-Ray analysis. 9. Quantitative X-Ray analysis : The Basics 10. Special topics in electron beam X-Ray microanalysis 11. Specimen preparation of Hard materials : Metals, ceramics, rocks, minerals, microelectronic and Packaged devices, particles , and fibers 12. Specimen preparation of polymer materials 13. Ambient-Temperature Specimen Preparation of Biological Material. 14. Low-Temperature specimen preparation. 15. Procedures for Elimination of charging in nonconducting specimens
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