Statistical analysis of microstructures in materials science / Joachim Osher

By: Ohser, JoachimContributor(s): Mücklick, FrankMaterial type: TextTextLanguage: English Publisher: New York : John wiley & Sons, 2000Description: 381 pISBN: 0471974862Subject(s): Microstructure | Stochastic geometryDDC classification: 620.11299
Contents:
1. Introduction 2. Methodological tools 3. Statical estimation of basic characteristics 4. Basic characteristics and digitalization 5. Covariance and spectral density 6. Size distribution of spherical particles 7. Nonspherical particles of constant shape 8. Size-shape distribution of particles 9. Arrangement of objects 10. Single-phase polyhedral microstructures.
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Item type Current location Collection Call number Copy number Status Date due Barcode
Libro OptoElectrónica Libro OptoElectrónica Laboratorio de Optoelectrónica
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Papel 620.11299 O38 (Browse shelf) Ej. 1 Available L000588

Ingreso MCM

1. Introduction 2. Methodological tools 3. Statical estimation of basic characteristics 4. Basic characteristics and digitalization 5. Covariance and spectral density 6. Size distribution of spherical particles 7. Nonspherical particles of constant shape 8. Size-shape distribution of particles 9. Arrangement of objects 10. Single-phase polyhedral microstructures.

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