High-Resolution X - Ray Scattering : from thin films to lateral nanostructures / Ullrich Pietsch
By: Pietsch, Ullrich
Contributor(s): Holy, Václav.; Baumbach, TiloPublisher: New York : Springer, 2004Edition: 2a edDescription: 408 pISBN: 0387400923Subject(s): Thin films -- Optical Properties | X-Rays DifractionDDC classification: 530.4'175 | Item type | Current location | Collection | Call number | Copy number | Status | Date due | Barcode |
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Libro OptoElectrónica
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Laboratorio de Optoelectrónica RESERVA | Papel | 530.4'175 P625 (Browse shelf) | Ej. 1 | Available | L000612 |
Browsing Laboratorio de Optoelectrónica shelves, Shelving location: RESERVA, Collection: Papel Close shelf browser
| 515.9 C563 5ed Variable compleja y aplicaciones / | 519.535 J75 2ed. Principal component analysis / | 523.01 W481 Astrofísica : | 530.4'175 P625 High-Resolution X - Ray Scattering : | 530.4'2 C346 Lectures on surface science / | 530 A454 Física : Alonso, Marcelo; Finn, Edward J. fundamentos cuantícos y estadisticos / | 530 A454 Física : Alonso, Marcelo; Finn, Edward J. campos y ondas / |
1. Elements for Designing an X-Ray diffraction experiment 2. Diffractometers and reflectometers 3. Scans and resolution in angular and reciprocal space 4. Basic principles 5. Kinematical theory 6. Dynamical theory 7. Semikinematical theory 8. Determination of layer thicknesses of single layers and multilayers 9. Lattice parameters and strains in epitaxial layers and multilayer 10. Diffuse scattering from volume defects in thin layers 11. X-Ray scattering by rough multilayers 12. X-Ray scattering by artificially lateral semiconductor nanostructures 13. Strain analysis in periodic nanostrustures 14. X-Ray scattering from self-organized structures
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