| 000 | 01124nam a2200193 a 4500 | ||
|---|---|---|---|
| 001 | 41547 | ||
| 020 | _a0849313546 | ||
| 037 | _cUS dollar: 380.000 | ||
| 082 |
_a543.0873 _bH536 |
||
| 100 |
_aHerbert, Christopher G. _95215 |
||
| 245 |
_aMass Spectrometry Basics / _cChristopher G. Herbert y Robert A.W. Johnstone |
||
| 260 |
_aEstados Unidos de América : _bCRC PRESS _c2003 |
||
| 300 | _a474 p. | ||
| 505 | _aChemical Ionization 2.Laser desorption Ionization 3.Electron Ionization (EI) 4.Fast-Atom Bombardment (FAB) and liquid phase secondary Ion Mass Spectrometry (LSIMS) Ionization 5.Field Ionization(FI) and field desorption 6.Coronas, plasmas and arcs 7.Thermal Ionization(TI)surface emission of lons 8.Electrospray Ionization 9.Atmospheric Pressure Ionization(API) 10.Z-Spray combined Inlet/Ion source 11.Thermospray and plasmaspray Interfaces 12.Particle -Beam interface 13.Dynamic fast-atom bombardment and liquid -phase secondary Ion Mass spectrometry (FAB/LSIMS) interface | ||
| 650 |
_aAnálisis de Espectro _976177 |
||
| 650 |
_aMasas _920678 |
||
| 650 |
_aEspectrometría de Masas _99248 |
||
| 942 |
_2ddc _cBK |
||
| 999 |
_c35815 _d35815 |
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