| 000 | 00746 a a2200217 04500 | ||
|---|---|---|---|
| 001 | 2568 | ||
| 003 | OSt | ||
| 005 | 20160916144608.0 | ||
| 008 | 150810b xxu||||| |||| 00| 0 eng d | ||
| 020 | _a354059129X | ||
| 041 | _aeng | ||
| 082 | 0 |
_a621.381'52 _bB344 |
|
| 100 | 4 | 0 |
_aBauer, Günther _99944 |
| 245 | 0 |
_aOptical characterization of epitaxial semiconductor layers / _cGünther Bauer |
|
| 260 | 4 |
_aNew York : _bSpringer, _c1996 |
|
| 300 | 4 | _a429 p. | |
| 505 | _a1. Introduction. 2. Analysis of epitaxial growth. 3. Spectroscopic ellipsometry. 4. Raman Spectroscopy. 5. Far-Infrared spectroscopy. 6. High resolution X-Ray Diffraction | ||
| 650 |
_aSemiconductor Layers _99945 |
||
| 700 | 4 | 0 |
_aRichter, Wolfgang. _99946 |
| 942 |
_2ddc _cLOPT |
||
| 999 |
_c47935 _d47935 |
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