Atomic force microscopy : scanning tunneling microscopy 3 / Samuel H. Cohen
By: Cohen, Samuel H
Contributor(s): Lightbody, Marcia LMaterial type: 
TextLanguage: English Publisher: New York : Kluwer Academic Publisher, 1999Description: 210 pISBN: 0306462974Subject(s): Atomic force microscopyDDC classification: 502.82 | Item type | Current location | Collection | Call number | Copy number | Status | Date due | Barcode |
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Libro OptoElectrónica
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Laboratorio de Optoelectrónica RESERVA | Papel | 502.82 C678 (Browse shelf) | Ej. 1 | Available | L000546 |
Browsing Laboratorio de Optoelectrónica shelves, Shelving location: RESERVA, Collection: Papel Close shelf browser
| 372.832 B748 Competencias ciudadanas desde la juventud Botero Jiménez, Nodier | 500.8 A213 Hombres de ciencia e independencia: | 502 R363 3ed. Transmission electron microscopy : | 502.82 C678 Atomic force microscopy : scanning tunneling microscopy 3 / Cohen, Samuel H. | 502.825 G617 Scanning electron microscopy and x-ray microanalysis / | 510.62 K92 3ed. Matemáticas avanzadas para ingeniería / | 515.1 R573 Mathematical methods for physics and engineering / Riley, K. F. |
Ingreso MCM
1. Keynote paper : A practical approach to understanding surface metrology and its applications 2. Applications of scanning probe microscopy in materials science : examples of surface modification and quantitative analysis 3. Scanning probe microscopy in biology with potential applications in forescics 4. Atomic manipulation of hydrogen on hydrogen-terminated silicon surfaces with scanning tunneling microscope 5. Apollo 11 lunar samples : An examination using tapping mode atomic force microscopy and other microscopic methods
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