Transmission electron microscopy : Physics of image formation and microanalysis / Ludwig Reimer
By: Reimer, Ludwig
Language: English Publisher: New York (State) : Springer-Verlag, 1993Edition: 3a. edDescription: 545 pISBN: 3540568492Subject(s): MicroanalysisDDC classification: 502
Contents:
1. Introduction 2. Particle optics of electrons 3. Wave optics of electrons 4. Elements of transmission electron microscope 5. Electron-specimen interactions 6. Scattering and phase contrast for amorphous specimens 7. Kinematical and dynamical theory of electron diffraction 8. Diffraction constrast and crystal-structure imaging 9. Analytical electron microscopy 10. Specimen damage by electron irradiation.
| Item type | Current location | Collection | Call number | Copy number | Status | Date due | Barcode |
|---|---|---|---|---|---|---|---|
Libro OptoElectrónica
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Laboratorio de Optoelectrónica RESERVA | Papel | 502 R363 3ed. (Browse shelf) | Ej. 1 | Available | L000064 |
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1. Introduction 2. Particle optics of electrons 3. Wave optics of electrons 4. Elements of transmission electron microscope 5. Electron-specimen interactions 6. Scattering and phase contrast for amorphous specimens 7. Kinematical and dynamical theory of electron diffraction 8. Diffraction constrast and crystal-structure imaging 9. Analytical electron microscopy 10. Specimen damage by electron irradiation.
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