Structural analysis of point defects in solids: An introduction to multiple magnetic resonance spectroscopy / Johann-Martin Spaeth
Language: English Publisher: New York (State) : Springer-Verlag, 1992Description: 367 pISBN: 3540536159Subject(s): Solids | Optical Properties | DefectsDDC classification: 530.412
Contents:
1. Introduction. 2. Fundamentals of electron paramagnetic resonance. 3. Electron paramagnetic resonance spectra 4. Optical detection of electron paramagnetic resonance 5.Electron nuclear double resonance 6.Determination of defect symmetries from ENDOR angular dependence. 7.Theoretical interpretation of superhyperfine and quadrupole interactions. 8.Technology of ENDOR spectrometers. 9.Experimental aspects of óptically detected EPR and ENDOR
Item type | Current location | Collection | Call number | Copy number | Status | Date due | Barcode |
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Libro OptoElectrónica | Laboratorio de Optoelectrónica RESERVA | Papel | 530.412 S732 (Browse shelf) | Ej. 1 | Available | L000061 |
1. Introduction. 2. Fundamentals of electron paramagnetic resonance. 3. Electron paramagnetic resonance spectra 4. Optical detection of electron paramagnetic resonance 5.Electron nuclear double resonance 6.Determination of defect symmetries from ENDOR angular dependence. 7.Theoretical interpretation of superhyperfine and quadrupole interactions. 8.Technology of ENDOR spectrometers. 9.Experimental aspects of óptically detected EPR and ENDOR
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