Universidad del Quindío

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Bauer, Günther

Optical characterization of epitaxial semiconductor layers / Günther Bauer - New York : Springer, 1996 - 429 p.

1. Introduction. 2. Analysis of epitaxial growth. 3. Spectroscopic ellipsometry. 4. Raman Spectroscopy. 5. Far-Infrared spectroscopy. 6. High resolution X-Ray Diffraction

354059129X


Semiconductor Layers

621.381'52 / B344
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