Optical characterization of epitaxial semiconductor layers / Günther Bauer
Language: English Publisher: New York : Springer, 1996Description: 429 pISBN: 354059129XSubject(s): Semiconductor Layers![](/opac-tmpl/bootstrap/images/filefind.png)
Contents:
1. Introduction. 2. Analysis of epitaxial growth. 3. Spectroscopic ellipsometry. 4. Raman Spectroscopy. 5. Far-Infrared spectroscopy. 6. High resolution X-Ray Diffraction
Item type | Current location | Collection | Call number | Copy number | Status | Date due | Barcode |
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Laboratorio de Optoelectrónica RESERVA | Papel | 621.381'52 B344 (Browse shelf) | Ej. 1 | Available | L000051 |
1. Introduction. 2. Analysis of epitaxial growth. 3. Spectroscopic ellipsometry. 4. Raman Spectroscopy. 5. Far-Infrared spectroscopy. 6. High resolution X-Ray Diffraction
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