Structural analysis of point defects in solids: An introduction to multiple magnetic resonance spectroscopy / Johann-Martin Spaeth
Language: English Publisher: New York (State) : Springer-Verlag, 1992Description: 367 pISBN: 3540536159Subject(s): Solids | Optical Properties | DefectsDDC classification: 530.412
Contents:
1. Introduction. 2. Fundamentals of electron paramagnetic resonance. 3. Electron paramagnetic resonance spectra 4. Optical detection of electron paramagnetic resonance 5.Electron nuclear double resonance 6.Determination of defect symmetries from ENDOR angular dependence. 7.Theoretical interpretation of superhyperfine and quadrupole interactions. 8.Technology of ENDOR spectrometers. 9.Experimental aspects of óptically detected EPR and ENDOR
Item type | Current location | Collection | Call number | Copy number | Status | Date due | Barcode |
---|---|---|---|---|---|---|---|
Libro OptoElectrónica | Laboratorio de Optoelectrónica RESERVA | Papel | 530.412 S732 (Browse shelf) | Ej. 1 | Available | L000061 |
Browsing Laboratorio de Optoelectrónica shelves, Shelving location: RESERVA, Collection: Papel Close shelf browser
530.41 P451 Optical characterization of semiconductors : | 530.41076 G624 Problemas de física del estado sólido / | 530.411 M379 Electronic structure : | 530.412 S732 Structural analysis of point defects in solids: | 530.412 T756 Optical processes in solids / | 530.4275 S714 Thin films preparation, characterization, applications / | 530.474 P218 The physics of phase transitions : |
1. Introduction. 2. Fundamentals of electron paramagnetic resonance. 3. Electron paramagnetic resonance spectra 4. Optical detection of electron paramagnetic resonance 5.Electron nuclear double resonance 6.Determination of defect symmetries from ENDOR angular dependence. 7.Theoretical interpretation of superhyperfine and quadrupole interactions. 8.Technology of ENDOR spectrometers. 9.Experimental aspects of óptically detected EPR and ENDOR
There are no comments on this title.