Structural analysis of point defects in solids: An introduction to multiple magnetic resonance spectroscopy / Johann-Martin Spaeth

By: Spaeth, Johann-MartinContributor(s): Niklas, Jürgen R.; Bartram, Ralph HLanguage: English Publisher: New York (State) : Springer-Verlag, 1992Description: 367 pISBN: 3540536159Subject(s): Solids | Optical Properties | DefectsDDC classification: 530.412
Contents:
1. Introduction. 2. Fundamentals of electron paramagnetic resonance. 3. Electron paramagnetic resonance spectra 4. Optical detection of electron paramagnetic resonance 5.Electron nuclear double resonance 6.Determination of defect symmetries from ENDOR angular dependence. 7.Theoretical interpretation of superhyperfine and quadrupole interactions. 8.Technology of ENDOR spectrometers. 9.Experimental aspects of óptically detected EPR and ENDOR
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Item type Current location Collection Call number Copy number Status Date due Barcode
Libro OptoElectrónica Libro OptoElectrónica Laboratorio de Optoelectrónica
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Papel 530.412 S732 (Browse shelf) Ej. 1 Available L000061

1. Introduction. 2. Fundamentals of electron paramagnetic resonance. 3. Electron paramagnetic resonance spectra 4. Optical detection of electron paramagnetic resonance 5.Electron nuclear double resonance 6.Determination of defect symmetries from ENDOR angular dependence. 7.Theoretical interpretation of superhyperfine and quadrupole interactions. 8.Technology of ENDOR spectrometers. 9.Experimental aspects of óptically detected EPR and ENDOR

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