Optical characterization of epitaxial semiconductor layers / Günther Bauer
By: Bauer, Günther
Contributor(s): Richter, WolfgangLanguage: English Publisher: New York : Springer, 1996Description: 429 pISBN: 354059129XSubject(s): Semiconductor LayersDDC classification: 621.381'52
Contents:
1. Introduction. 2. Analysis of epitaxial growth. 3. Spectroscopic ellipsometry. 4. Raman Spectroscopy. 5. Far-Infrared spectroscopy. 6. High resolution X-Ray Diffraction
| Item type | Current location | Collection | Call number | Copy number | Status | Date due | Barcode |
|---|---|---|---|---|---|---|---|
Libro OptoElectrónica
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Laboratorio de Optoelectrónica RESERVA | Papel | 621.381'52 B344 (Browse shelf) | Ej. 1 | Available | L000051 |
Browsing Laboratorio de Optoelectrónica shelves, Shelving location: RESERVA, Collection: Papel Close shelf browser
| 620.5 G578 Handbook of nanoscience, engineering, and technology / | 620.5 P911 Advanced nanotechnology / | 620.5 S571 Nanostructure science and technology / | 621.381'52 B344 Optical characterization of epitaxial semiconductor layers / | 621.3 E24 Teoría y problemas de electromagnetismo / | 621.31242 C767 Electrochemical supercapacitors : | 621.361 W246 Photoacoustic imaging and spectroscopy / |
1. Introduction. 2. Analysis of epitaxial growth. 3. Spectroscopic ellipsometry. 4. Raman Spectroscopy. 5. Far-Infrared spectroscopy. 6. High resolution X-Ray Diffraction
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